Middleborough, MA, United States of America

Philip J Prakop

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Shawmut Corporation. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Philip J Prakop. Retrieved from https://idiyas.com/inventor/philip-j-prakop

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: The Innovations of Philip J Prakop

Introduction

Philip J Prakop is an accomplished inventor based in Middleboro, MA (US). He has made significant contributions to the field of laminate testing through his innovative patent. His work focuses on enhancing the quality control processes in manufacturing.

Latest Patents

Philip holds a patent for the "Detection of small holes in laminates." This invention addresses the critical need for identifying defects in laminates during production. The method involves applying a vacuum to the laminate's surface while it moves through a processing machine. This allows for the inspection of the laminate to detect any liquid that has penetrated through small holes, ensuring product integrity.

Career Highlights

Philip is associated with Shawmut Corporation, where he applies his expertise in laminate technology. His role at the company has allowed him to develop and refine his innovative ideas, contributing to advancements in the industry.

Collaborations

Philip has worked alongside notable colleagues such as Gregory F Carey and James H Wyner. Their collaboration has fostered a creative environment that encourages innovation and problem-solving.

Conclusion

Philip J Prakop's contributions to laminate testing through his patent demonstrate his commitment to innovation in manufacturing. His work not only enhances product quality but also showcases the importance of thorough testing in industrial processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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