This inventor holds 1 USPTO granted patent. Top assignee: United States of America as Represented by the Secretary of the Air Force. Active years: 1992.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1992
Title: The Innovations of Philip D Mumford
Introduction
Philip D Mumford is an accomplished inventor based in Dayton, OH (US). He is known for his significant contributions to the field of semiconductor measurement technology. His work has led to advancements that enhance the understanding and performance of GaAs wafers.
Latest Patents
Mumford holds a patent for an innovative On-wafer Hall-effect measurement system. This non-destructive measurement system is designed to produce whole wafer maps of sheet Hall concentration and Hall mobility in a GaAs wafer. The system requires only van der Pauw patterns to facilitate the measurements. It includes an automatic test prober apparatus that has been modified to incorporate a powerful permanent magnet. This magnet generates a magnetic field that produces a Hall effect in the GaAs wafer. The parametric measurement system is coupled through test probes to the van der Pauw patterns, allowing for the measurement of sheet resistivity, Hall voltage, and magnetic field strength. From these measurements, values of sheet Hall concentration and mobility are derived, stored, and mapped.
Career Highlights
Mumford's career is marked by his role as an inventor for the United States of America as Represented by the Secretary of the Air Force. His work has been pivotal in advancing measurement techniques in semiconductor technology.
Collaborations
Mumford has collaborated with notable individuals in his field, including David C Look. Their partnership has contributed to the development of innovative technologies and measurement systems.
Conclusion
Philip D Mumford's contributions to the field of semiconductor measurement technology are noteworthy. His patent for the On-wafer Hall-effect measurement system exemplifies his innovative spirit and dedication to advancing technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
