Winchester, United Kingdom

Phil R Lee

This inventor holds 3 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 2013-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Phil R Lee. Retrieved from https://idiyas.com/inventor/phil-r-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.3

ph-index = 2

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2013-2018

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3 patents (USPTO):Explore Patents

Title: Phil R. Lee: Inventor in Transaction Server Performance Monitoring

Introduction

Phil R. Lee is an inventor based in Winchester, Great Britain, whose work includes innovations in transaction server performance monitoring. He is associated with International Business Machines Corporation (IBM) and has 3 patents.

Latest Patents

Lee’s listed patent, “Transaction Server Performance Monitoring Using Component Performance Data,” describes a method for anticipating failures in transaction-processing environments. The system receives a transaction server’s performance metric during nominal operation and compares it with benchmark data. If the metric falls outside an established variance threshold, the system generates an alert indicating a potential impending failure.

Career Highlights

Lee’s patent work focuses on using component performance data to monitor transaction servers and identify signs of possible performance failure. This approach supports earlier detection of operational issues in transaction-processing systems.

Collaborations

Lee’s listed coworkers include Andy Wright and Jim A. Harrison. His association with IBM places his work within a company known for developing and patenting computing technologies.

Conclusion

Phil R. Lee’s patent work highlights a practical approach to transaction server reliability by comparing live performance metrics with benchmarks and alerting users to potential failures.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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