Zevenaar, Netherlands

Petrus Wilem Van Andel

This inventor holds 1 USPTO granted patent. Top assignee: Quest Integrity USA, LLC. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Petrus Wilem Van Andel. Retrieved from https://idiyas.com/inventor/petrus-wilem-van-andel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Petrus Wilem Van Andel

Introduction

Petrus Wilem Van Andel is a notable inventor based in Zevenaar, Netherlands. He has made significant contributions to the field of in-line inspection and crack detection. His innovative techniques facilitate the in-service inspection of various assets while they remain operational in the field.

Latest Patents

Petrus holds a patent for a technique that enables rapid and reliable inspection of cracks or other defects in tubular elements, such as deep-water oil and gas risers and flow lines. This patent is crucial for ensuring the integrity and safety of assets after they have become operational.

Career Highlights

Petrus is currently employed at Quest Integrity USA, LLC, where he continues to develop and refine his innovative techniques. His work is instrumental in advancing inspection technologies that enhance asset reliability and safety.

Collaborations

Petrus has collaborated with notable professionals in his field, including Robert De Lorenzo and Paul Manzak. These collaborations have further enriched his work and contributed to the development of effective inspection solutions.

Conclusion

Petrus Wilem Van Andel's contributions to in-line inspection and crack detection demonstrate his commitment to innovation and safety in asset management. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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