This inventor holds 4 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignees: Wallac Oy, Perkinelmer Singapore Pte Limited. Active years: 2000-2015.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2000-2015
Title: Innovations of Petri Kivelä
Introduction
Petri Kivelä is a notable inventor based in Piispanristi, Finland. He has made significant contributions to the field of optical analysis, particularly in the development of sample measurement systems. With a total of 4 patents to his name, Kivelä's work showcases his expertise and innovative spirit.
Latest Patents
Kivelä's latest patents include a "Sample Measurement System" and a "Multi-Purpose Measurement System." The Sample Measurement System relates to an apparatus and method for optically analyzing samples contained in sample sites of a sample holder through fluorescence. This apparatus features a first light source with multiple individual light sources that emit narrow wavelength bands, along with a wavelength-tunable monochromator for further limiting these bands. The invention allows for the manufacturing of a microplate reader capable of fluorescence measurements across a continuous wavelength range while keeping costs reasonable.
The Multi-Purpose Measurement System is designed for optically analyzing samples in a similar manner. It includes a first light source, at least one second light source, and a monochromator that connects to the first light source. This system also incorporates a light relay that enables light from the second source to bypass the monochromator, facilitating a versatile sample analyzer in a cost-effective manner.
Career Highlights
Throughout his career, Petri Kivelä has worked with several prominent companies, including Wallac Oy and PerkinElmer Singapore Pte Limited. His experience in these organizations has contributed to his development as an inventor and innovator in the field of optical analysis.
Collaborations
Kivelä has collaborated with various professionals in his field, including his coworker Jyrki Laitinen. These collaborations have likely enriched his work and led to further advancements in his inventions.
Conclusion
Petri Kivelä's contributions to optical analysis through his innovative patents demonstrate his significant role in the field. His work continues to influence the development of cost-effective and versatile measurement systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
