Rüschlikon, Switzerland

Peter Vettiger

This inventor holds 1 USPTO granted patent. Top assignee: Seiko Instruments Inc. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter Vettiger. Retrieved from https://idiyas.com/inventor/peter-vettiger-qahico5g

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: The Innovations of Peter Vettiger

Introduction

Peter Vettiger is a notable inventor based in Ruschlikon, Switzerland. He has made significant contributions to the field of microprobe technology. His work has led to advancements that are essential in various applications, particularly in the realm of scanning probe apparatus.

Latest Patents

Peter Vettiger holds a patent for a microprobe and scanning probe apparatus having a microprobe. This innovation showcases his expertise and commitment to enhancing technological capabilities. He has 1 patent to his name, reflecting his contributions to the field.

Career Highlights

Peter Vettiger is currently employed at Seiko Instruments Inc. His role at the company allows him to work on cutting-edge technologies that push the boundaries of what is possible in microprobe applications. His career is marked by a dedication to innovation and excellence.

Collaborations

Throughout his career, Peter has collaborated with esteemed colleagues such as Nobuhiro Shimizu and Hiroshi Takahashi. These partnerships have fostered an environment of creativity and innovation, leading to significant advancements in their respective fields.

Conclusion

Peter Vettiger's contributions to microprobe technology and his innovative spirit make him a key figure in the industry. His work continues to inspire future advancements and collaborations in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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