Peter Statham

Title: Peter Statham and X-Ray Detector Innovation

Introduction

Peter Statham is an inventor associated with High Wycombe, Great Britain, and Oxford Instruments Nanotechnology Tools Limited. His patent work concerns detector technology for analysing specimens with electron-beam equipment.

Latest Patents

The supplied information identifies one patent associated with Statham: “Material Analysis with Multiple Detectors.” The invention describes a detector module positioned beneath the polepiece of an electron-beam assembly. It combines multiple X-ray sensor elements with one or more electron sensor elements to detect X-rays and backscattered electrons produced when the beam interacts with a specimen.

Each X-ray sensor element monitors the energy of individual incoming X-ray photons. The patent also specifies a total active area greater than 20 mm² for the X-ray sensor elements and a radial extent of less than 10 mm for at least part of the module. The disclosure further covers an apparatus and method for analysing a specimen. Statham is credited with 1 patent in the information provided.

Career Highlights

Statham’s listed work connects him with Oxford Instruments Nanotechnology Tools Limited and focuses on instrumentation for specimen analysis. The detector design brings X-ray and electron sensing together in a compact module intended for use with an electron-beam assembly.

Collaborations

The supplied information names Simon Burgess and Santokh Bhadare as Statham’s coworkers. Their specific roles in the patent or related development are not stated.

Conclusion

Peter Statham’s recorded patent contribution centers on a compact, multi-detector system that supports specimen analysis by measuring X-rays and backscattered electrons.