San Antonio, TX, United States of America

Peter Starr

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: The University of Texas System. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter Starr. Retrieved from https://idiyas.com/inventor/peter-starr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Innovations by Peter Starr in Parameter Measurement

Introduction

Peter Starr is an accomplished inventor based in San Antonio, TX. He has made significant contributions to the field of parameter measurement through his innovative designs and methods. His work is particularly notable for its application in tight spaces, where traditional devices may not fit.

Latest Patents

Peter Starr holds a patent for "Devices and methods for parameter measurement." This invention features a thin-film, diaphragm-based device that can perform a variety of sensing and actuating operations. The design is particularly advantageous in millimeter, micrometer, or nanometer tight spaces, making it a valuable tool in various applications.

Career Highlights

Peter is affiliated with The University of Texas System, where he continues to advance his research and development efforts. His work has garnered attention for its practical applications and innovative approach to measurement technology.

Collaborations

Some of his notable coworkers include Steven Bailey and Mauli Agrawal. Their collaborative efforts contribute to the ongoing research and development in the field of parameter measurement.

Conclusion

Peter Starr's innovative work in parameter measurement exemplifies the importance of creativity and technical expertise in advancing technology. His contributions are paving the way for new applications in various fields.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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