Mainz, Germany

Peter Schwagler

This inventor holds 1 USPTO granted patent. Top assignee: Hoechst Aktiengesellschaft. Active years: 1978.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter Schwagler. Retrieved from https://idiyas.com/inventor/peter-schwagler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1978

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1 patent (USPTO):Explore Patents

Title: The Innovations of Peter Schwagler

Introduction

Peter Schwagler is a notable inventor based in Mainz, Germany. He has made significant contributions to the field of photographic technology. His work primarily focuses on methods that enhance the efficiency and quality of photographic printing.

Latest Patents

Peter Schwagler holds a patent for "Methods and apparatus for automatic exposure control." This invention pertains to a method of exposure control in photographic printing apparatus. It is designed for printing from originals made on various types of photographic material. The method aims to improve the consistency and quality of printed images.

Career Highlights

Peter Schwagler has had a distinguished career, working with Hoechst Aktiengesellschaft, a prominent company in the chemical and pharmaceutical industry. His expertise in photographic technology has allowed him to develop innovative solutions that address industry challenges.

Collaborations

Throughout his career, Peter has collaborated with talented individuals such as Dorothee Griesch and Herbert Schroter. These partnerships have contributed to the advancement of his inventions and the overall progress in the field.

Conclusion

Peter Schwagler's contributions to photographic technology through his innovative patent demonstrate his commitment to enhancing the industry. His work continues to influence the way photographic materials are processed and printed.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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