Helmond, Netherlands

Peter Roelen

This inventor holds 1 USPTO granted patent. Top assignee: Ultra-D Cooperatief U.a.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter Roelen. Retrieved from https://idiyas.com/inventor/peter-roelen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: The Innovations of Peter Roelen

Introduction

Peter Roelen is an accomplished inventor based in Helmond, Netherlands. He has made significant contributions to the field of 3D display technology. His innovative work has led to the development of a unique patent that enhances the viewing experience of three-dimensional images.

Latest Patents

Peter Roelen holds a patent for an invention titled "Overscan for 3D display." This patent describes a display processor and a computer-implemented method for processing three-dimensional image data for display on a 3D display. The technology enables the emission of a series of views of the 3D image data, facilitating stereoscopic viewing at multiple positions. The degree of overscan is determined based on depth range parameters, which characterize the perceived depth by the viewer.

Career Highlights

Peter Roelen is associated with Ultra-d Cooperatief U.A., where he continues to innovate in the realm of 3D display technologies. His work has garnered attention for its potential applications in various industries, including entertainment and virtual reality.

Collaborations

Peter collaborates with Bart Gerard Bernard Barenbrug, contributing to advancements in their field. Their partnership exemplifies the importance of teamwork in driving innovation.

Conclusion

Peter Roelen's contributions to 3D display technology through his patent demonstrate his commitment to enhancing visual experiences. His work continues to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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