Dresden, Germany

Peter Reinig


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Peter Reinig

Introduction

Peter Reinig is a notable inventor based in Dresden, Germany. He has made significant contributions to the field of semiconductor technology. His work focuses on methods and apparatuses that enhance the measurement of surface profiles in semiconductor materials.

Latest Patents

One of Peter Reinig's key patents is titled "Method and apparatus for measuring a surface profile of a sample." This invention involves producing an imprint of the surface profile to be examined in a deformable and curable transfer material. The sample typically consists of processed semiconductor material, such as a patterned semiconductor wafer. The transfer material can be a thermoplastic or another material that can be deformed and cured under specific conditions. The imprint created can be measured using established methods, providing valuable insights into the surface characteristics of semiconductor materials. He holds 1 patent for this innovative approach.

Career Highlights

Peter Reinig has built a successful career at Infineon Technologies AG, a leading company in semiconductor solutions. His expertise in surface measurement techniques has contributed to advancements in the industry. His work has implications for improving the quality and performance of semiconductor devices.

Collaborations

Throughout his career, Peter has collaborated with several talented individuals, including Harald Bloess and Uwe Wellhausen. These collaborations have fostered innovation and have led to the development of cutting-edge technologies in the semiconductor field.

Conclusion

Peter Reinig's contributions to semiconductor technology through his innovative patent and collaborations highlight his importance in the field. His work continues to influence advancements in measuring techniques for semiconductor materials.

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