Graz, Austria

Peter Pechtl

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1988.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter Pechtl. Retrieved from https://idiyas.com/inventor/peter-pechtl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:

goldMedal1 out of 834,570 
Other
 patents

Years Active: 1988

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Peter Pechtl - Innovator in Particle Size Analysis

Introduction

Peter Pechtl is a notable inventor based in Graz, Austria. He has made significant contributions to the field of particle size analysis, showcasing his expertise through innovative methods and apparatuses.

Latest Patents

Peter Pechtl holds a patent for a "Method of and apparatus for grain-size analysis." This invention allows for particle size analysis to be conducted in a cuvette that is traversed by multiple vertically spaced light curtains. The design ensures precision measurements without the complications that can arise from scanning a sedimentation cell. He has 1 patent to his name.

Career Highlights

Throughout his career, Peter has demonstrated a commitment to advancing the science of particle size analysis. His work has been instrumental in improving measurement techniques, which are crucial for various applications in research and industry.

Collaborations

Peter has collaborated with notable colleagues, including Manfred Hangl and Gernot Staudinger. Their combined expertise has contributed to the development of innovative solutions in their field.

Conclusion

Peter Pechtl is a distinguished inventor whose work in particle size analysis has paved the way for more accurate measurement techniques. His contributions continue to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…