Peter Lisherness

Title: The Innovative Mind of Peter Lisherness: A Deep Dive into His Recent Patents

Introduction

Peter Lisherness, based in Goleta, California, is a notable inventor with a remarkable contribution to the field of circuit testing through his patents. With a total of two patents to his name, Lisherness has developed advanced testing mechanisms aimed at enhancing the efficiency of testing IP blocks integrated in System on Chip (SoC) architectures. His work is particularly important in the ever-evolving electronics and semiconductor industry.

Latest Patents

Lisherness's latest patents include a "Functional Fabric-Based Test Wrapper for Circuit Testing of IP Blocks" and a "Functional Fabric-Based Test Controller for Functional and Structural Test and Debug". Both patents focus on innovative Test Access Mechanism (TAM) architectures that facilitate the testing of IP blocks efficiently.

The first patent outlines a test wrapper integrated on the SoC that utilizes a Test Controller to package test data and commands, which are then sent to the test wrappers via an interconnect fabric. This architecture allows for effective circuit-level testing of IP blocks, providing a seamless interface for control signals and feedback during testing.

The second patent further establishes the significance of the TAM by detailing its implementation in a fabric-to-fabric bridge, enabling comprehensive testing of IP blocks across different fabric connections. This innovation demonstrates Lisherness's commitment to enhancing the functional and structural testing processes within the electronic design framework.

Career Highlights

Currently, Peter Lisherness is associated with Intel Corporation, where his expertise and innovative solutions are work in tandem with the company's dedication to pushing technological boundaries. His contributions towards improving testing solutions have been pivotal in ensuring high-quality performance of digital circuits.

Collaborations

Throughout his career, Lisherness has collaborated with notable professionals such as Srinivas Patil and Abhijit Jas. These partnerships showcase the collaborative spirit prevalent in high-tech companies, where cross-pollination of ideas fosters innovation and advancement in technology.

Conclusion

Peter Lisherness’s inventions and patents reflect his inventive spirit and unwavering commitment to enhancing testing mechanisms for Integrated Circuits. His work continues to influence the semiconductor industry, ensuring that products are tested efficiently and effectively before reaching consumers. His journey and contributions serve as an inspiration for aspiring inventors and innovators in the field.