Sunbury, OH, United States of America

Peter Kirigiti

This inventor holds 1 USPTO granted patent. Top assignee: Mettler-Toledo Gmbh. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter Kirigiti. Retrieved from https://idiyas.com/inventor/peter-kirigiti

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Peter Kirigiti and Innovations in Weighing Accuracy

Introduction

Peter Kirigiti is an inventor based in Sunbury, Ohio, whose patent work addresses the accuracy and communication of weight readings from scales. His invention focuses on helping users understand not only a measured weight but also an estimate of the measurement’s potential error.

Latest Patents

Kirigiti is associated with 1 patent: “Methods for Providing Weight Accuracy Indications for Scales, Systems, and Apparatus for the Same.” The method applies to scales such as vehicle scales. A controller receives load data from one or more sensors and determines a weight reading, then estimates the weighment’s error magnitude using load data, additional data, or both. The reading is displayed electronically on a user device alongside information based on the estimated error.

Career Highlights

Kirigiti is associated with Mettler-Toledo GmbH, a company known for weighing and measurement technologies. His patent reflects an approach to making scale results more informative by presenting an indication of estimated measurement accuracy alongside the weight.

Collaborations

The provided information identifies Eric V. Wechselberger and Daniel Benedum as Kirigiti’s coworkers. Their inclusion points to professional connections within the weighing and measurement technology field.

Conclusion

Peter Kirigiti’s patent contributes to scale technology by pairing weight readings with estimated error information, helping users interpret measurements with greater context.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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