Newark, NJ, United States of America

Peter J Scriffignana

This inventor holds 1 USPTO granted patent. Top assignee: The Bendix Corporation. Active years: 1982.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter J Scriffignana. Retrieved from https://idiyas.com/inventor/peter-j-scriffignana

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1982

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1 patent (USPTO):Explore Patents

Title: Peter J Scriffignana: Innovator in Accurate Level Sensing Technology

Introduction

Peter J Scriffignana is a notable inventor based in Newark, NJ (US). He is recognized for his contributions to the field of sensor technology, particularly through his innovative patent for an accurate level sensor. His work has significant implications for various applications requiring precise level measurements.

Latest Patents

Scriffignana holds a patent for an accurate level sensor that features an electrolytic switch mounted within a thermally insulated chamber. This design includes multiple layers of thermal insulation to minimize sensitivity to ambient temperature conditions. The sensor is engineered to maintain the inertial reference member level with a high degree of accuracy, making it a valuable tool in various industrial applications.

Career Highlights

Throughout his career, Peter J Scriffignana has been associated with The Bendix Corporation, where he has contributed to advancements in sensor technology. His innovative approach and dedication to precision have established him as a respected figure in his field.

Collaborations

Scriffignana has worked alongside his coworker, Theodore T Hadeler, contributing to the development of cutting-edge technologies in their respective areas of expertise.

Conclusion

Peter J Scriffignana's work in developing an accurate level sensor showcases his commitment to innovation and precision in technology. His contributions continue to influence the industry and highlight the importance of accurate measurement systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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