This inventor holds 2 USPTO granted patents. Top assignee: Institute for Systems Biology. Active years: 2008-2010.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2008-2010
Title: Innovations of Peter I Nelson
Introduction
Peter I Nelson is a notable inventor based in Fort Collins, CO (US). He has made significant contributions to the field of radiation detection and alignment. With a total of 2 patents, his work focuses on enhancing the precision of radiation beam positioning.
Latest Patents
One of Peter I Nelson's latest patents is titled "Compositions and methods for drop boundary detection and radiation beam alignment." This invention provides an apparatus and method for determining the position of a radiation beam. The apparatus includes a first reflective surface and a second reflective surface, which are arranged to form the reflective exterior of a wedge. Additionally, it features a first detector to detect radiation reflected from the first reflective surface and a second detector to detect radiation reflected from the second reflective surface. The method involves directing a radiation beam to the reflective exterior of the wedge, selectively detecting radiation from both surfaces, and determining the position of the radiation beam based on the difference in the amount of radiation detected.
Career Highlights
Peter I Nelson is associated with the Institute for Systems Biology, where he applies his expertise in radiation detection technologies. His innovative approaches have contributed to advancements in the field, making him a respected figure among his peers.
Collaborations
Peter collaborates with Gerrit Jan Van Den Engh, further enhancing the research and development efforts at the Institute for Systems Biology.
Conclusion
Peter I Nelson's work exemplifies the impact of innovative inventions in the field of radiation detection and alignment. His contributions continue to advance technology and improve precision in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
