Dallas, TX, United States of America

Peter Hones

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Essilor International. Active years: 2024.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations in Ophthalmic Lens Production by Peter Hones

Introduction

Peter Hones is an accomplished inventor based in Dallas, TX (US), known for his significant contributions to the field of ophthalmic lens production. With a focus on innovative methods and systems, he has developed a patent that enhances the efficiency and precision of lens manufacturing.

Latest Patents

Peter Hones holds a patent for "Methods and systems for producing ophthalmic lenses." This patent outlines a process that includes identifying multiple zones within a spatial representation of a lens blank. For each zone, specific parameters are selected to produce the lens, which is then created by removing material from the lens blank according to these parameters. This innovative approach allows for greater customization and accuracy in lens production. He has 1 patent to his name.

Career Highlights

Peter Hones is currently employed at Essilor International, a leading company in the optical industry. His work at Essilor has allowed him to apply his inventive skills to real-world applications, contributing to advancements in lens technology.

Collaborations

Throughout his career, Peter has collaborated with notable colleagues, including Sébastien Piraube and Bruce Taylor. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Peter Hones is a prominent figure in the field of ophthalmic lens production, with a patent that showcases his innovative approach to manufacturing. His contributions continue to influence the industry, making him a valuable asset to Essilor International and the optical community.

Profile summary based on public USPTO records.
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