Waltham, MA, United States of America

Peter Hardman

This inventor holds 1 USPTO granted patent. Top assignee: Evident Scientific, Inc.. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter Hardman. Retrieved from https://idiyas.com/inventor/peter-hardman-7mds9e0k

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: The Innovations of Peter Hardman

Introduction

Peter Hardman is an accomplished inventor based in Waltham, MA (US). He has made significant contributions to the field of X-ray technology. His innovative work has led to the development of a unique X-ray instrument that enhances the accuracy of X-ray analysis.

Latest Patents

Peter Hardman holds a patent for an X-ray instrument with an ambient temperature detector. This X-ray analyzer comprises at least one detector configured to detect a secondary X-ray from a test object irradiated by an X-ray source, and provide a corresponding energy signal. Additionally, it features a temperature sensor that senses a temperature related to the detector. The signal processor processes the energy signal and provides a temperature-compensated output for an X-ray event. This invention showcases his ability to integrate temperature sensing with X-ray detection, improving the reliability of the results.

Career Highlights

Peter Hardman is currently associated with Evident Scientific, Inc., where he continues to push the boundaries of scientific innovation. His work at the company focuses on developing advanced imaging technologies that have applications in various fields, including medical diagnostics and materials analysis.

Conclusion

Peter Hardman's contributions to the field of X-ray technology exemplify the impact of innovative thinking in scientific research. His patent for an X-ray instrument with an ambient temperature detector is a testament to his expertise and dedication to advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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