Santa Clara, CA, United States of America

Peter G Eldredge


Average Co-Inventor Count = 2.7

ph-index = 2

Forward Citations = 207(Granted Patents)


Company Filing History:


Years Active: 1984-1985

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2 patents (USPTO):Explore Patents

Title: Innovations by Peter G Eldredge

Introduction

Peter G Eldredge is a notable inventor based in Santa Clara, CA. He has made significant contributions to the field of photomask inspection technology. With a total of 2 patents, his work focuses on enhancing the quality and efficiency of inspection systems.

Latest Patents

Eldredge's latest patents include an "Automatic system and method for inspecting hole quality." This invention features an automatic inspection system designed to evaluate holes in a mask. The system incorporates carriage means, illumination means, optical means, photosensitive detector means, and signal processing means. The mask is positioned horizontally by the carriage means, allowing the optical means to project a focused image onto the photosensitive detector. The photodiodes in the detector respond to light transmitted through the holes, enabling the signal processing means to scan outputs and store a digital representation of the mask. This system performs inspection measurements and comparison tests, including checks for smoothness, area, and diameter of the holes. It also identifies completely blocked or mispositioned holes by comparing detected information to a database.

Another significant patent is the "Automatic photomask inspection method and system." This invention involves receiving two sets of digitized scan data from optical detectors that simultaneously scan identical portions of a photomask. The system compares the two sets of data to detect defects and evaluates whether the defect data represents real or false information. By scanning lines containing defect data twice, the system produces a real defect data set that eliminates false defects.

Career Highlights

Peter G Eldredge is currently employed at Kla Instruments Corporation, where he continues to innovate in the field of photomask inspection. His work has contributed to advancements in the accuracy and reliability of inspection systems.

Collaborations

Eldredge has collaborated with notable colleagues, including William H Broadbent, Jr and Steve Buchholz. Their combined expertise has furthered the development of innovative inspection technologies.

Conclusion

Peter G Eldredge's contributions to photomask inspection technology demonstrate his commitment to innovation and quality. His patents reflect a deep understanding of the complexities involved in ensuring precision in manufacturing processes.

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