Aldershot, United Kingdom

Peter F Stillwell

This inventor holds 1 USPTO granted patent. Top assignee: The Rank Organisation Plc. Active years: 1982.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter F Stillwell. Retrieved from https://idiyas.com/inventor/peter-f-stillwell

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1982

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1 patent (USPTO):Explore Patents

Title: Peter F. Stillwell and Thermal Scanning Devices

Introduction

Peter F. Stillwell is an inventor associated with Aldershot, Great Britain. His patent work includes an optical scanning approach for capturing and processing picture information from a scene under surveillance.

Latest Patents

Stillwell is credited with 1 patent, titled “Thermal Scanning Devices.” The invention describes an optical scanning device that uses rotating or oscillating optical elements to scan incident light across an array of detector elements. Successive scans of multiple detector rows overlap, allowing each line of picture information to be scanned at least twice during a complete monitoring cycle. The resulting signals are summed to reinforce coherent picture information while adding noise incoherently, then processed into television format for display.

Career Highlights

Stillwell’s listed patent is associated with The Rank Organisation Plc. It presents a method for improving the collection and processing of image information through repeated, overlapping scans.

Collaborations

William T. Moore and David George Demaine are identified as Stillwell’s coworkers.

Conclusion

Peter F. Stillwell’s patent on thermal scanning devices describes an approach to repeated optical scanning and signal summation for producing television-format images.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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