Oxford, United Kingdom

Peter Eric Taylor

This inventor holds 1 USPTO granted patent. Top assignee: Mirada Solutions Limited. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter Eric Taylor. Retrieved from https://idiyas.com/inventor/peter-eric-taylor

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: The Innovations of Peter Eric Taylor

Introduction

Peter Eric Taylor is a notable inventor based in Oxford, GB. He has made significant contributions to the field of image processing, particularly through his innovative patent. With a focus on comparing images taken under varying conditions, Taylor's work has implications for various imaging systems.

Latest Patents

Taylor holds a patent for a method of comparing images. This patent involves comparing first and second images taken on different imaging systems and under different exposure conditions. The process includes applying a model to the data representing the first image to derive a representation at a common processing level with the second image. A further model is then applied to this representation to create a corresponding representation of the first image.

Career Highlights

Peter Eric Taylor is associated with Mirada Solutions Limited, where he continues to develop and refine his innovative ideas. His work has garnered attention for its practical applications in image processing technology.

Collaborations

Some of his notable coworkers include Ralph Highnam and Bruno Ancelin, who have contributed to the collaborative environment at Mirada Solutions Limited.

Conclusion

Peter Eric Taylor's contributions to image processing through his patent demonstrate his innovative spirit and dedication to advancing technology. His work continues to influence the field and inspire future developments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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