Omaha, NE, United States of America

Peter C Iwen

This inventor holds 1 USPTO granted patent. Top assignee: The Board of Regents of the University of Nebraska. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter C Iwen. Retrieved from https://idiyas.com/inventor/peter-c-iwen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 43(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Innovations of Peter C Iwen in Molecular Detection

Introduction

Peter C Iwen is a notable inventor based in Omaha, NE (US). He has made significant contributions to the field of molecular detection, particularly in identifying pathogenic fungal species. His work is crucial for advancing medical diagnostics and improving patient outcomes.

Latest Patents

Peter C Iwen holds a patent titled "Materials and methods for molecular detection of clinically relevant pathogenic fungal species." This patent provides materials and methods that rapidly and specifically differentiate between pathogenic and non-pathogenic Aspergillus species in biological samples. His innovative approach enhances the accuracy of fungal detection, which is vital for effective treatment.

Career Highlights

Iwen is affiliated with the University of Nebraska, where he conducts research and develops new methodologies in molecular diagnostics. His expertise in the field has positioned him as a key figure in advancing fungal detection technologies.

Collaborations

Peter C Iwen has collaborated with esteemed colleagues such as Steven H Hinrichs and Travis Henry. These partnerships have fostered a collaborative environment that promotes innovation and research excellence.

Conclusion

Peter C Iwen's contributions to molecular detection are invaluable, particularly in the context of pathogenic fungi. His patent and ongoing research efforts continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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