Peter C Hill

Title: The Innovations of Peter C. Hill

Introduction

Peter C. Hill is a notable inventor based in Washington, DC. He has made significant contributions to the field of optics, particularly in the measurement of aberrations in optical systems. His work is recognized for its potential to enhance the accuracy of optical measurements.

Latest Patents

Peter C. Hill holds a patent for a "System and method for null-lens wavefront sensing." This innovative method involves measuring aberrations in a null-lens, including assembly and alignment aberrations. The null-lens is utilized for measuring aberrations in aspheric optics. Light propagates from the aspheric optic location through the null-lens while sweeping a detector through the null-lens focal plane. Image data is collected at various locations around the focal plane. The method simulates light propagation to the collection locations for each collected image. Null-lens aberrations can be extracted by applying image-based wavefront sensing to the collected images and simulation results. This advancement improves the accuracy of measuring aspheric optic aberrations. Peter C. Hill has 1 patent to his name.

Career Highlights

Peter C. Hill is associated with the United States of America as represented by the Administrator of NASA. His work at NASA has allowed him to engage in cutting-edge research and development in optical technologies. His contributions have been instrumental in advancing the field of wavefront sensing.

Collaborations

Peter has collaborated with notable colleagues, including Patrick L. Thompson and David L. Aronstein. These collaborations have fostered innovation and have led to significant advancements in their respective fields.

Conclusion

Peter C. Hill's work in null-lens wavefront sensing exemplifies the importance of innovation in optical measurement technologies. His contributions continue to influence the field and pave the way for future advancements.