San Diego, CA, United States of America

Peter Baker

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Ion Beam Applications S.a.. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter Baker. Retrieved from https://idiyas.com/inventor/peter-baker-8pibfabs

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Peter Baker

Introduction

Peter Baker is a notable inventor based in San Diego, CA. He has made significant contributions to the field of X-ray technology. His work focuses on improving the efficiency and effectiveness of X-ray irradiation processes.

Latest Patents

Peter Baker holds a patent for an "Apparatus for X-ray irradiation." This invention concerns an apparatus designed to irradiate goods with X-rays. It features a first source of X-rays that emits X-rays along a first irradiation volume centered on a longitudinal axis. The apparatus includes a conveyor that drives goods through the irradiation volume, exposing a first portion of the goods along a vertical axis.

Career Highlights

Peter Baker is associated with Ion Beam Applications S.A., where he applies his expertise in X-ray technology. His innovative approach has led to advancements in the field, enhancing the capabilities of X-ray irradiation systems.

Collaborations

Peter has collaborated with notable colleagues, including Frédéric Stichelbaut and Christophe Malice. Their combined efforts contribute to the ongoing development of cutting-edge technologies in their field.

Conclusion

Peter Baker's work exemplifies the spirit of innovation in X-ray technology. His patent and collaborations highlight his commitment to advancing this important area of research.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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