Schoenaich, Germany

Peter Ast

This inventor holds 1 USPTO granted patent. Top assignee: Hewlett-Packard Company. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter Ast. Retrieved from https://idiyas.com/inventor/peter-ast

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Peter Ast and Dye-Containing Polymer Technology.

Introduction

Peter Ast is an inventor associated with Schoenaich, Germany, and Hewlett-Packard Company. His patent work includes a process for preparing dye-containing polymers for spectroscopic sample analysis.

Latest Patents

Ast is credited with 1 patent: “Preparing a Dye-Containing Polymer.” The invention describes polymerizing monomers in the presence of a dye to create a bulk polymer. The bulk material, or slices cut from it, can be measured with a spectrometer to determine the dye-containing polymer’s optical properties. The bulk polymer is then ground into particles for use in a fiber-optic sensor. Because the particles retain the optical properties of the bulk material, those properties can be determined through measurements of the bulk polymer.

Career Highlights

Ast’s listed patent connects polymer production with spectroscopic measurement and fiber-optic sensing. The process is designed to make it possible to characterize the material before converting it into particles for sensor use.

Collaborations

Ast’s listed coworkers include Eugene W. Reynolds and Darlene J. Spira-Solomon. The available information does not specify their roles in the patent or their working relationship with Ast.

Conclusion

Peter Ast’s patent describes a practical method for producing and characterizing dye-containing polymer particles for fiber-optic sensors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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