Magdeburg, Germany

Peter Albrecht

This inventor holds 2 USPTO granted patents. Top assignee: Inb Vision Ag. Active years: 2004-2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter Albrecht. Retrieved from https://idiyas.com/inventor/peter-albrecht-9p0qbaqs

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 42(Granted Patents)


Company Filing History:


Years Active: 2004-2006

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2 patents (USPTO):Explore Patents

Title: The Innovations of Peter Albrecht

Introduction

Peter Albrecht is a notable inventor based in Magdeburg, Germany. He has made significant contributions to the field of surface measurement and flaw detection. With a total of two patents to his name, Albrecht's work showcases his expertise and innovative spirit.

Latest Patents

Albrecht's latest patents include a method of detecting flaws in the structure of a surface. This invention relates to a technique for identifying imperfections in a test object's surface by comparing it to a flawless master part. The method utilizes an artificial neuronal network to create a virtual master part for comparison with characteristic numbers derived from the grey values of sequential images captured by a digital camera. His second patent involves a method of taking three-dimensional measurements of object surfaces, further demonstrating his commitment to advancing measurement technologies.

Career Highlights

Peter Albrecht is currently associated with Inb Vision AG, where he continues to develop innovative solutions in his field. His work has garnered attention for its practical applications and technological advancements.

Collaborations

Albrecht has collaborated with notable colleagues, including Bernd Michaelis and Tilo Lilienblum. Their combined expertise contributes to the success of their projects and innovations.

Conclusion

Peter Albrecht's contributions to the field of surface measurement and flaw detection highlight his innovative capabilities as an inventor. His patents reflect a commitment to advancing technology and improving measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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