Deltona, FL, United States of America

Pertti Alapuranen

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Verizon Patent and Licensing Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pertti Alapuranen. Retrieved from https://idiyas.com/inventor/pertti-alapuranen-o12fynye

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Pertti Alapuranen: Inventor in Radio Access Network Testing

Introduction

Pertti Alapuranen is an inventor associated with Deltona, Florida, and Verizon Patent and Licensing Inc. His work includes an invention for testing radio access network components using field radio-frequency input.

Latest Patents

Alapuranen is credited with 1 patent: “Systems and Methods for Testing Radio Access Network Components Using Field Radio Frequency Input.” The invention describes a network simulator module that receives real-time radio-frequency data representing emulated channel conditions at a simulated location. A physical radio access network device or user equipment can be located at, or communicate with, the simulator. The module receives signal-measurement data based on the radio-frequency input and uses those measurements to assess the device’s performance.

Career Highlights

Alapuranen’s listed patent work is associated with Verizon Patent and Licensing Inc. The invention focuses on evaluating network equipment under realistic, field-based radio-frequency conditions.

Collaborations

Mourad B. Takla is identified as Alapuranen’s coworker. The available information does not specify the nature of their collaboration on the patent.

Conclusion

Pertti Alapuranen’s patent addresses practical testing of radio access network devices by combining real-time radio-frequency input, simulated channel conditions, and performance measurements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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