Gullaug, Norway

Per Olaf Pahr

This inventor holds 2 USPTO granted patents. Top assignee: Omnivision Technologies, Inc.. Active years: 2015-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Per Olaf Pahr. Retrieved from https://idiyas.com/inventor/per-olaf-pahr-4fqsdyi0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.3

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2015-2016

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2 patents (USPTO):Explore Patents

Title: Per Olaf Pahr: Innovator in Image Sensor Technology

Introduction

Per Olaf Pahr is a notable inventor based in Gullaug, Norway. He has made significant contributions to the field of image sensor technology, holding two patents that showcase his innovative approach to enhancing image capture and processing.

Latest Patents

One of his latest patents is for an image sensor with a scaled filter array and in-pixel binning. This invention includes a pixel array with individual pixels grouped into pixel kernels, allowing for high-resolution, low-sensitivity sub-images and low-resolution, high-sensitivity images. The second patent is a bandgap reference circuit with offset voltage removal. This circuit utilizes an amplifier and a series of switches to effectively cancel the offset voltage, enhancing the accuracy of the reference circuit.

Career Highlights

Per Olaf Pahr is currently employed at Omnivision Technologies, Inc., where he continues to develop cutting-edge technologies in image sensing. His work has positioned him as a key player in the advancement of sensor technology.

Collaborations

He collaborates with fellow innovator Johannes Solhusvik, contributing to the dynamic environment of research and development at Omnivision Technologies.

Conclusion

Per Olaf Pahr's contributions to image sensor technology through his patents reflect his commitment to innovation and excellence in the field. His work continues to influence advancements in imaging technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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