Hubei, China

Peng Jiang

This inventor holds 1 USPTO granted patent. Top assignee: Huazhong University of Science and Technology. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peng Jiang. Retrieved from https://idiyas.com/inventor/peng-jiang-jtlzqht9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Innovations of Peng Jiang in Building Recognition Technology.

Introduction

Peng Jiang is a notable inventor based in Hubei, China. He has made significant contributions to the field of building recognition technology. His innovative approach combines laser and infrared imaging techniques to enhance the precision of target recognition.

Latest Patents

Peng Jiang holds a patent for an "Above-ground building recognition method and navigation method combining laser and infrared." This invention outlines a comprehensive process that includes taking an infrared image of the ground from the air, detecting and positioning suspected targets, and utilizing laser imaging to improve accuracy. The method effectively filters out interference and extracts shape features for target matching, thereby enhancing the precision of building positioning.

Career Highlights

Peng Jiang is affiliated with Huazhong University of Science and Technology, where he continues to advance his research and innovations. His work has garnered attention for its practical applications in navigation and building recognition.

Collaborations

Peng has collaborated with notable colleagues, including Tianxu Zhang and Yimeng Chen, contributing to the advancement of technology in their field.

Conclusion

Peng Jiang's innovative methods in building recognition demonstrate the potential of integrating laser and infrared technologies. His contributions are paving the way for more accurate navigation systems and improved recognition techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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