Helsinki, Finland

Pellervo Ruponen

This inventor holds 1 USPTO granted patent and 3 published patent applications and 3 EPO patents. Top assignee: Nokia Technologies Oy. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pellervo Ruponen. Retrieved from https://idiyas.com/inventor/pellervo-ruponen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Pellervo Ruponen: Innovator in Non-Invasive Measurement Technologies

Introduction

Pellervo Ruponen is an inventor based in Helsinki, Finland. He has made significant contributions to the field of non-invasive measurement technologies. Although he currently holds no granted patents, his work has been influential in the development of innovative medical devices.

Latest Patent Applications

Ruponen's latest patent applications include "Methods and Systems for Non-Invasive Measurement and Monitoring of Physiological Parameters." This application describes a pulse oximetry probe designed to measure blood from the internal carotid artery. The system features a light emitter and a light detector positioned on opposite sides of the nose, allowing for accurate measurements of peripheral arterial oxygen saturation and other physiological parameters. Another application is for a "Photodetector Apparatus," which includes a light source and a photodetector configured to receive light from a focus point, enhancing the accuracy of physiological measurements.

Conclusion

Pellervo Ruponen's work in non-invasive measurement technologies showcases his innovative spirit and dedication to advancing medical science. His contributions, although not yet reflected in granted patents, hold promise for future developments in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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