San Francisco, CA, United States of America

Peleg Atar

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Docusign, Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peleg Atar. Retrieved from https://idiyas.com/inventor/peleg-atar-52814gl0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2025

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Peleg Atar - Innovator in Blockchain Auditing

Introduction: Peleg Atar is an inventor based in San Francisco, CA (US), known for his contributions to the field of blockchain technology. He currently works at DocuSign, Inc., where he focuses on developing innovative solutions for auditing systems. Although he has not yet been granted any patents, his work in patent applications showcases his commitment to advancing technology.

Latest Patent Applications: Peleg Atar's notable patent application is titled "Audit Records Monitoring Using a Blockchain Structure." This application describes a centralized auditing system that receives an audit block containing one or more audit files generated by an audit agent running in an audited device. The audit block also stores a first digital signature corresponding to a previous audit block, along with a second digital signature generated based on the audit files and the first digital signature. The auditing system verifies the integrity of the received audit block using the stored digital signatures and adds the block to an audit register, along with the included audit files to an audit database.

Conclusion: Peleg Atar is an emerging inventor in the field of blockchain auditing, with a focus on enhancing the integrity and efficiency of auditing processes. His innovative approach has the potential to significantly impact the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…