Vtt, Finland

Pekka Teppola


 

Average Co-Inventor Count = 3.6

ph-index = 2

Forward Citations = 4(Granted Patents)


Location History:

  • VTT, FI (2014 - 2017)
  • Varkaus, FI (2017)

Company Filing History:


Years Active: 2014-2017

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3 patents (USPTO):Explore Patents

Title: Pekka Teppola: Innovator in Optical Measurement Technologies

Introduction

Pekka Teppola is a notable inventor based in VTT, Finland. He has made significant contributions to the field of optical measurement technologies, holding a total of 3 patents. His work focuses on improving the accuracy and efficiency of optical measurement systems.

Latest Patents

One of Pekka Teppola's latest patents is a "System and method for optical measurement of a target." This invention relates to a system that allows for the optical measurement of a target, which can be illuminated in various ways. The system utilizes a Fabry-Perot interferometer to enhance measurement accuracy and stability, addressing the limitations of prior art optical measurement systems that often relied on mechanical filter wheels and photomultiplier tubes. Another significant patent is the "Optical apparatus and method for fluorescence measurement of analytes comprising backscattering detection." This apparatus includes an ultraviolet light source and multiple detectors to analyze the interaction between ultraviolet light and a sample, providing valuable data on the sample's properties.

Career Highlights

Pekka Teppola has worked at Teknologian Tutkimuskeskus VTT, a prominent research institution in Finland. His innovative work has contributed to advancements in optical measurement technologies, making him a respected figure in his field.

Collaborations

Throughout his career, Pekka has collaborated with notable colleagues such as Heikki Saari and Christer Holmlund. These collaborations have further enriched his research and development efforts.

Conclusion

Pekka Teppola's contributions to optical measurement technologies demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the challenges in the field and offer practical solutions that enhance measurement accuracy.

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