The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2017
Filed:
Apr. 08, 2014
Teknologian Tutkimeskeskus Vtt, VTT, FI;
Heikki Saari, VTT, FI;
Christer Holmlund, VTT, FI;
Uula Kantojarvi, VTT, FI;
Rami Mannila, VTT, FI;
Antti Lamminpaa, Espoo, FI;
Pekka Teppola, VTT, FI;
Teknologian tutkimeskeskus VTT, VTT, FI;
Abstract
The invention relates to a system and a method for optical measurement of a target, wherein the target is illuminated, either actively illuminated, reflecting ambient light, or self illuminating, and a measurement light beam received from the target or through it is detected. The prior art optical measurement systems generally include mechanical filter wheels and photomultiplier tubes, which cause the equipment to be expensive, large-sized and often not sufficiently accurate and stable. The objective of the invention is achieved with a solution, in which the illuminating light beam and/or measurement light beam is led through a Fabry-Perot interferometeror a set of two or more Fabry-Perot Interferometers, and the Fabry-Perot interferometer or a set of two or more Fabry-Perot Interferometersis controlled into different modes during the measurement of a single target. The invention can be applied inoptical measurements where, for example, reflectance, absorption of fluorescence of the target is measured.