Turku, Finland

Pekka Hanninen

This inventor holds 3 USPTO granted patents. Top assignee: Other. Active years: 1996-1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pekka Hanninen. Retrieved from https://idiyas.com/inventor/pekka-hanninen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.3

ph-index = 3

Forward Citations = 157(Granted Patents)


Location History:

  • FIN-20100 Turku, FI (1996)
  • 20100 Turku, FI (1998)
  • Turku, FI (1999)

Company Filing History:

goldMedal3 out of 834,513 
Other
 patents

Years Active: 1996-1999

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3 patents (USPTO):Explore Patents

Title: Pekka Hanninen: Innovator in Biospecific Assay Methods

Introduction

Pekka Hanninen is a notable inventor based in Turku, Finland. He has made significant contributions to the field of biospecific multiparameter assay methods. With a total of 3 patents to his name, his work has garnered attention in the scientific community.

Latest Patents

Hanninen's latest patents include a biospecific multiparameter assay method and a luminescence-scanning microscopy process. These innovations reflect his commitment to advancing scientific methodologies and improving assay techniques.

Career Highlights

Throughout his career, Pekka Hanninen has focused on developing cutting-edge technologies that enhance the accuracy and efficiency of scientific assays. His work has positioned him as a key figure in his field.

Collaborations

Hanninen has collaborated with esteemed colleagues such as Erkki Soini and Stefan W. Hell. These partnerships have further enriched his research and contributed to the success of his projects.

Conclusion

Pekka Hanninen's contributions to biospecific assay methods and his innovative spirit make him a significant figure in the realm of scientific inventions. His work continues to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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