Company Filing History:
Years Active: 2017
Title: Peiyong Zhang: Innovator in Programmable Test Chip Technology
Introduction
Peiyong Zhang is a notable inventor based in Hangzhou, China. He has made significant contributions to the field of semiconductor testing through his innovative designs and patents. His work focuses on enhancing the efficiency and effectiveness of testing processes in integrated circuits.
Latest Patents
Peiyong Zhang holds a patent for a "Programmable Addressable Test Chip." This invention includes a target chip to be tested and addressing circuits fabricated on the same wafer. The addressing circuits can be strategically placed in the scribe lines or a pre-allocated area of the wafer. When testing the target chip, a circuit connecting the target chip and the addressing circuits can be fabricated on demand. In certain scenarios, the target chip is not connected to the addressing circuits, and a Device Under Test (DUT) array exists in a scribe line with a prefabricated connecting circuit. When the need for testing the target chip arises, the prefabricated connecting circuit can be cut, allowing for the fabrication of a connecting circuit between the target chip and the addressing circuits. This innovative approach enables better study of the manufacturing process based on results from such test chips. Peiyong Zhang has 1 patent to his name.
Career Highlights
Peiyong Zhang is currently employed at Semitronix Corporation, where he continues to develop cutting-edge technologies in semiconductor testing. His work has been instrumental in advancing the capabilities of programmable test chips, which are crucial for modern electronics.
Collaborations
Throughout his career, Peiyong Zhang has collaborated with talented individuals such as Xu Ouyang and Yongjun Zheng. These collaborations have fostered a creative environment that encourages innovation and the development of new technologies.
Conclusion
Peiyong Zhang is a prominent figure in the field of semiconductor testing, with a focus on programmable test chip technology. His contributions have the potential to significantly impact the efficiency of testing processes in the electronics industry.