Beijing, China

Peiqi Duan

This inventor holds 1 USPTO granted patent. Top assignees: Northwestern University, Peking University. Active years: 2022.


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Peiqi Duan: Innovator in High-Resolution Imaging Technology

Introduction

Peiqi Duan is a notable inventor based in Beijing, China. She has made significant contributions to the field of imaging technology, particularly through her innovative patent that enhances the capabilities of imaging systems.

Latest Patents

Peiqi Duan holds a patent for a "System and method for high-resolution, high-speed, and noise-robust imaging." This advanced imaging system includes an event camera designed to capture the first image of a scene. Additionally, it features a shutter camera that is collocated with the event camera, allowing for the capture of a second image of the same scene. The system is equipped with a processor that applies guided event filtering (GEF) on both images, ultimately generating a third image based on the filtering process. This innovation addresses the challenges of noise and speed in imaging, making it a valuable advancement in the field.

Career Highlights

Throughout her career, Peiqi Duan has worked at prestigious institutions such as Northwestern University and Peking University. Her experience in these academic environments has contributed to her expertise and innovative approach to imaging technology.

Collaborations

Peiqi has collaborated with notable colleagues, including Oliver Strider Cossairt and Boxin Shi. These collaborations have further enriched her research and development efforts in the field of imaging.

Conclusion

Peiqi Duan's contributions to high-resolution imaging technology exemplify her innovative spirit and dedication to advancing the field. Her patent and career achievements highlight her role as a leading inventor in this important area of research.

Profile summary based on public USPTO records.
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