Taichung, Taiwan

Pei-Yi Su

This inventor holds 1 USPTO granted patent and 5 published patent applications. Top assignee: Taiwan Semiconductor Manufacturing Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pei-Yi Su. Retrieved from https://idiyas.com/inventor/pei-yi-su-z8cfltvv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Pei-Yi Su: Semiconductor Contamination-Handling Innovation.

Introduction

Pei-Yi Su is an inventor associated with Taichung, Taiwan, and Taiwan Semiconductor Manufacturing Co., Ltd. The available information identifies 1 patent associated with Su.

Latest Patents

Su’s patent, “Contamination Handling for Semiconductor Apparatus,” describes a lithography apparatus with a photoresist coating unit that performs coating processes on a substrate. A detection unit determines the level of contamination adhering to the apparatus’s sidewall, and a controller adjusts apparatus operations by comparing that level with a baseline cleanliness requirement. This approach links contamination monitoring with operational control in semiconductor manufacturing equipment.

Career Highlights

The patent reflects work focused on contamination detection and process control for lithography equipment. These capabilities can help semiconductor manufacturers monitor cleanliness conditions and adjust equipment operations accordingly.

Collaborations

The provided information lists Fu-Chun Hsieh and Chih-Che Lin as Su’s coworkers. It does not specify their roles in the patent or describe particular collaborative contributions.

Conclusion

Pei-Yi Su’s identified patent addresses contamination monitoring and responsive control in lithography apparatus, highlighting an innovation relevant to semiconductor manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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