This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2015.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2015
Title: Pei-San Tsai: Innovator in Flow Velocity Measurement Technology
Introduction
Pei-San Tsai is a notable inventor based in Taipei, Taiwan. She has made significant contributions to the field of flow measurement technology. Her innovative approach has led to the development of a unique flow velocity meter that enhances the accuracy of current measurements.
Latest Patents
Pei-San Tsai holds a patent for a "Flow velocity meter having signal generating module with phase locked loop for generating continuous wave signal." This invention utilizes a phase locked loop to generate an output signal, which is then used to measure the speed of a current under test. The flow velocity meter is designed to receive a reflection signal from the current and calculate its speed based on the frequency difference between the output and reflection signals. Additionally, the device includes an inclinometer that measures the depression angle and horizontal angle, allowing for adjustable orientation during installation.
Career Highlights
Throughout her career, Pei-San Tsai has demonstrated a commitment to advancing measurement technologies. Her work has not only contributed to the scientific community but has also provided practical solutions for various industries that rely on accurate flow measurements.
Collaborations
Pei-San has collaborated with notable colleagues, including Ping-Chang Tsao and Hung-Chun Lin. These partnerships have fostered an environment of innovation and have led to further advancements in their respective fields.
Conclusion
Pei-San Tsai's contributions to flow measurement technology exemplify her dedication to innovation. Her patented flow velocity meter represents a significant advancement in the field, showcasing her expertise and commitment to improving measurement accuracy.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile