Peh Kwan Han

Title: Peh Kwan Han - Innovator in Optical Inspection Systems

Introduction

Peh Kwan Han is a notable inventor based in Singapore, SG. He has made significant contributions to the field of optical inspection systems, particularly in the area of leaded components. His innovative approach has led to the development of a unique inspection system that enhances the accuracy of component positioning.

Latest Patents

Peh Kwan Han holds 1 patent for his invention titled "Leaded Components Inspection System." This optical inspection system is designed to determine the positional information of a leaded electrical component with respect to a reference. The system features a datum placed near the leads of the component, providing a reliable reference point. A light source illuminates the leads and the datum, allowing images to be formed along various optical paths. The imaging subsystem captures these images and analyzes them to provide precise positional information.

Career Highlights

Peh Kwan Han is currently employed at Hewlett-Packard Company, where he continues to innovate and develop advanced technologies. His work has been instrumental in improving inspection processes within the electronics industry.

Collaborations

Peh has collaborated with talented coworkers, including Peng Seng Toh and Chiat Pin Tay, who contribute to the dynamic environment of innovation at Hewlett-Packard Company.

Conclusion

Peh Kwan Han's contributions to optical inspection systems exemplify the spirit of innovation in the technology sector. His work not only enhances the accuracy of component inspection but also showcases the importance of collaboration in driving technological advancements.