Los Angeles, CA, United States of America

Pavel Igorevich Ionov

This inventor holds 1 USPTO granted patent. Top assignee: The Aerospace Corporation. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pavel Igorevich Ionov. Retrieved from https://idiyas.com/inventor/pavel-igorevich-ionov

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Pavel Igorevich Ionov: Innovator in Doppler LIDAR Technology

Introduction

Pavel Igorevich Ionov is a notable inventor based in Los Angeles, CA. He has made significant contributions to the field of atmospheric measurement technologies. His innovative work focuses on systems and methods for Doppler light detection and ranging (LIDAR).

Latest Patents

Pavel Ionov holds a patent for "Systems, methods, and apparatus for Doppler LIDAR." This invention includes a method for measuring atmospheric wind speed. The method involves tuning the light output of a laser to specific wavelengths, directing the light to the atmosphere, and analyzing the backscattered light to determine wind speed.

Career Highlights

Pavel Ionov is associated with The Aerospace Corporation, where he applies his expertise in atmospheric measurement technologies. His work has implications for various applications, including meteorology and aerospace engineering.

Collaborations

Pavel collaborates with Steven M Beck, contributing to advancements in LIDAR technology and atmospheric research.

Conclusion

Pavel Igorevich Ionov is a distinguished inventor whose work in Doppler LIDAR technology has the potential to enhance our understanding of atmospheric conditions. His contributions are valuable to both scientific research and practical applications in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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