Pikesville, MD, United States of America

Pavan Jain

This inventor holds 1 USPTO granted patent. Top assignee: Insitutec, Inc.. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pavan Jain. Retrieved from https://idiyas.com/inventor/pavan-jain-0jdqldzm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Pavan Jain: Innovator in Surface Profilometry

Introduction

Pavan Jain is a notable inventor based in Pikesville, MD (US). He has made significant contributions to the field of surface profiling through his innovative patent. His work focuses on enhancing the precision and efficiency of surface measurement techniques.

Latest Patents

Pavan Jain holds a patent for a "Method and apparatus using a closed loop controlled actuator for surface profilometry." This invention includes an apparatus designed for profiling the surface of a workpiece. It features a probe that makes contact with the workpiece surface, a sensor that determines the force between the probe and the surface, and an actuator that adjusts the probe's position to maintain a constant force. The closed control loop, which includes a controller, regulates the actuator's operation based on sensor information.

Career Highlights

Pavan Jain is currently employed at Insitutec, Inc., where he applies his expertise in surface profiling technologies. His innovative approach has positioned him as a key figure in the development of advanced measurement systems.

Collaborations

Some of his notable coworkers include Stuart T. Smith and Marcin B. Bauza, who contribute to the collaborative environment at Insitutec, Inc. Their combined efforts enhance the company's innovative capabilities.

Conclusion

Pavan Jain's contributions to surface profilometry through his patented technology exemplify his commitment to innovation in engineering. His work continues to influence the field and improve measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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