San Francisco, CA, United States of America

Paul Van Hummelen

This inventor holds 1 USPTO granted patent and 7 published patent applications. Top assignee: Natera, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Paul Van Hummelen. Retrieved from https://idiyas.com/inventor/paul-van-hummelen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Paul Van Hummelen: Inventor in Transplant Rejection Testing.

Introduction

Paul Van Hummelen is an inventor associated with Natera, Inc. His patent work concerns methods for assessing transplant rejection using biological samples from transplant recipients.

Latest Patents

Van Hummelen is credited with 1 patent, titled “Methods for Determination of Transplant Rejection.” The disclosed methods measure the amount of torque teno virus (TTV) and donor-derived cell-free DNA in a recipient’s blood, plasma, serum, or urine. The results are used to assess whether donor-derived cell-free DNA exceeds a threshold associated with transplant rejection and whether the TTV level indicates a decreased or increased immune response.

Career Highlights

The available information identifies Van Hummelen as an inventor working with Natera, Inc. His patent focuses on combining measurements of donor-derived cell-free DNA and TTV to support the evaluation of transplant recipients.

Collaborations

Van Hummelen’s listed coworkers include Hossein Tabriziani and Jessica Tang. The provided information does not specify their roles in the patent or their particular contributions.

Conclusion

Paul Van Hummelen’s patent describes a diagnostic approach that combines viral and donor-derived DNA measurements to help assess transplant rejection and immune response.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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