Location History:
- San Jose, CA (US) (1981 - 1982)
- Gilroy, CA (US) (1985 - 1987)
Company Filing History:
Years Active: 1981-1987
Title: Paul Sandland: Innovator in Automatic Wafer Inspection Technology
Introduction
Paul Sandland is a notable inventor based in Gilroy, CA (US), recognized for his contributions to the field of semiconductor wafer inspection. With a total of 5 patents, Sandland has developed innovative technologies that enhance the efficiency and accuracy of wafer inspection processes.
Latest Patents
Among his latest patents, Sandland has created an "Electronic control of an automatic wafer inspection system." This system is designed for both micro and macro inspection of patterned wafers. It includes an X-Y stage for positioning the wafer, multiple cassettes for storage, and a transfer arm for moving the wafer to various inspection stations. The system also features an optical system for macro inspection, autofocus apparatus for real-time imaging, and mechanisms for precise wafer alignment and inspection.
Another significant patent is the "Method and apparatus for automatic wafer inspection." This invention encompasses a complete semiconductor wafer inspection system that automates the transportation of wafers from storage to inspection stations. It utilizes a high-speed image computer to process optical images and perform inspections under varying lighting conditions and magnifications.
Career Highlights
Throughout his career, Paul Sandland has worked with prominent companies in the semiconductor industry, including Kla Instruments Corporation and KLA Instrument Corporation. His experience in these organizations has contributed to his expertise in wafer inspection technologies.
Collaborations
Sandland has collaborated with notable professionals in the field, including Kenneth Levy and Russell M Singleton. These partnerships have likely influenced his innovative approaches and advancements in wafer inspection systems.
Conclusion
Paul Sandland's work in automatic wafer inspection technology has significantly impacted the semiconductor industry. His patents reflect a commitment to innovation and precision in wafer inspection processes.