Paul R Sharratt

Title: Paul R Sharratt: Innovator in Wafer Level Testing

Introduction

Paul R Sharratt is a notable inventor based in Meridian, ID (US). He has made significant contributions to the field of semiconductor testing, holding 2 patents that enhance the efficiency of wafer level testing processes. His work is particularly relevant in the context of modern electronics, where precision and reliability are paramount.

Latest Patents

One of Paul R Sharratt's latest patents is titled "Structure for temporarily isolating a die from a common conductor to facilitate wafer level testing." This invention provides an apparatus for temporarily isolating a die from other dice on a wafer that are commonly connected to one or more common conductors. The conductors are linked to each die through a temporary isolation device, such as a diode. During one set of test procedures, the common conductor supplies a signal to all dice, while the temporary isolation device can isolate a die from the common conductor during another set of test procedures. This innovation significantly improves the testing process by allowing for more controlled and accurate evaluations of individual dies.

Career Highlights

Paul R Sharratt is currently employed at Micron Technology Incorporated, a leading company in the semiconductor industry. His role at Micron has allowed him to apply his inventive skills in a practical setting, contributing to advancements in technology that impact various sectors.

Collaborations

One of his notable coworkers is Phillip E Byrd, with whom he has likely collaborated on various projects within the company. Their combined expertise contributes to the innovative environment at Micron Technology.

Conclusion

Paul R Sharratt's contributions to wafer level testing through his patents demonstrate his commitment to advancing technology in the semiconductor field. His work not only enhances testing efficiency but also supports the broader goals of innovation in electronics.