Claygate, United Kingdom

Paul Pontin

This inventor holds 1 USPTO granted patent. Top assignee: 3Dlabs Inc., Ltd.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Paul Pontin. Retrieved from https://idiyas.com/inventor/paul-pontin-e85ayduh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 92(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Paul Pontin: Innovator in Specialized Processing Chips

Introduction

Paul Pontin is a notable inventor based in Claygate, GB. He has made significant contributions to the field of specialized processing chips, particularly in the area of in-circuit testing. His innovative approach has paved the way for advancements in diagnostic capabilities within complex logic systems.

Latest Patents

Pontin holds a patent for an in-circuit test using scan chains. This invention involves a specialized processing chip, such as a graphics accelerator, where the host interface allows access to diagnostic registers in most of the complex logic on the chip, excluding the host interface itself. This design advantageously enables the host CPU to obtain direct access to the register contents in the specialized chip. He has 1 patent to his name.

Career Highlights

Paul Pontin is currently employed at 3Dlabs Inc., Ltd., where he continues to innovate and develop cutting-edge technologies. His work has been instrumental in enhancing the performance and reliability of processing chips used in various applications.

Collaborations

Some of his notable coworkers include David Robert Baldwin and Nicholas J N Murphy. Their collaborative efforts contribute to the ongoing success and innovation at 3Dlabs Inc., Ltd.

Conclusion

Paul Pontin's contributions to the field of specialized processing chips demonstrate his commitment to innovation and excellence. His patent for in-circuit testing reflects his expertise and the impact of his work on the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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