This inventor holds 2 USPTO granted patents. Top assignee: Educational Testing Service. Active years: 2016-2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2016-2022
Title: Innovations by Paul Papierman
Introduction
Paul Papierman is an accomplished inventor based in Bridgewater, NJ (US). He has made significant contributions to the field of educational testing through his innovative systems and methods. With a total of 2 patents, his work focuses on enhancing the integrity and security of testing environments.
Latest Patents
Papierman's latest patents include "Systems and methods for detecting unusually frequent exactly matching and nearly matching test responses." This invention describes computer-implemented systems that identify evidence of a circulated key by analyzing test responses from multiple test takers. The system assesses the strength of the evidence based on the probability of matching responses, tagging those for further investigation.
Another notable patent is "Systems and methods for detecting fraud in spoken tests using voice biometrics." This invention automates the detection of imposture in test settings by comparing voice samples and prints. The system generates raw scores to determine if fraud is likely, allowing for appropriate responses to be triggered based on predetermined criteria.
Career Highlights
Paul Papierman works at Educational Testing Service, where he applies his expertise to develop innovative solutions for testing challenges. His contributions have significantly improved the reliability of test results and the overall testing process.
Collaborations
Some of his notable coworkers include Shelby J Haberman and Yi-Hsuan Lee, who collaborate with him on various projects within the organization.
Conclusion
Paul Papierman's innovative work in educational testing has led to the development of critical systems that enhance the integrity of assessments. His contributions continue to shape the future of testing methodologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
