Location History:
- Warren, MA (US) (2012 - 2014)
- Shelton, CT (US) (2013 - 2018)
Company Filing History:
Years Active: 2012-2018
Title: Paul L St Cyr: Innovator in Sample Analysis Technology
Introduction
Paul L St Cyr is a notable inventor based in Shelton, Connecticut, with a significant contribution to the field of sample analysis technology. He holds a total of eight patents, showcasing his innovative spirit and dedication to advancing analytical methods.
Latest Patents
Among his latest patents, St Cyr has developed sample holders and methods of using them. Certain embodiments of this invention are directed to sample holders that can effectively retain a sample support for direct sample analysis. In some instances, the sample support includes a first and a second plate with apertures, allowing for the analysis of samples using direct sample analysis techniques. Additionally, he has created direct sample analysis device adapters and methods of using them. These adapters are designed for coupling a direct sample analysis device to analytical instruments, such as mass spectrometers. Some examples of these adapters include an internal coupler separated from an external coupler through an insulator.
Career Highlights
St Cyr has had a distinguished career, working with prominent companies in the field. He has been associated with PerkinElmer Health Sciences, Inc. and PerkinElmer LAS, Inc., where he contributed to various innovative projects and advancements in analytical technology.
Collaborations
Throughout his career, St Cyr has collaborated with talented individuals, including Michael L DelVecchio and Craig M Whitehouse. These collaborations have further enriched his work and contributed to the development of cutting-edge technologies in sample analysis.
Conclusion
Paul L St Cyr is a remarkable inventor whose contributions to sample analysis technology have made a significant impact in the field. His innovative patents and collaborations reflect his commitment to advancing analytical methods and improving the efficiency of sample analysis.