The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2013
Filed:
Nov. 18, 2010
Juan C. Ivaldi, Redding, CT (US);
Paul L. St. Cyr, Shelton, CT (US);
Eugene Chow, Singapore, SG;
Mark C. Werner, Brookfield Center, CT (US);
Juan C. Ivaldi, Redding, CT (US);
Paul L. St. Cyr, Shelton, CT (US);
Eugene Chow, Singapore, SG;
Mark C. Werner, Brookfield Center, CT (US);
PerkinElmer Health Sciences, Inc., Waltham, MA (US);
Abstract
A photonic measurement system, such as an atomic absorption spectrometer, includes source, sample and detection modules that are interconnected by fiber optic cables. A first set of fiber optic cables guides light from one or more light sources in the source module to each of at least two analysis chambers in the sample module. A second set of fiber optic cables guides light from the analysis chambers to a detector in the detection module. The detector provides to a processing sub-system signals that correspond to intensities of the guided light. One analysis chamber is selected to perform a sample analysis at a given time, and the processing sub-system processes the signals associated with the selected analysis chamber as measurement signals. The processing sub-system may further process the signals associated with a given non-selected analysis chamber as reference signals.