Vught, Netherlands

Paul J L H Bouwens

This inventor holds 6 USPTO granted patents. Top assignees: Rockwool International A/s, Rockwool A/s. Active years: 2021-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Paul J L H Bouwens. Retrieved from https://idiyas.com/inventor/paul-j-l-h-bouwens

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 3

Forward Citations = 59(Granted Patents)


Company Filing History:


Years Active: 2021-2024

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6 patents (USPTO):Explore Patents

Title: The Innovations of Paul J L H Bouwens

Introduction

Paul J L H Bouwens is a notable inventor based in Vught, Netherlands. He has made significant contributions to the field of measurement technology, holding a total of six patents. His work has been influential in various industries, showcasing his expertise and innovative spirit.

Latest Patents

Among his latest patents, Paul has developed advanced measuring instruments that enhance precision and efficiency. These innovations reflect his commitment to improving measurement techniques and addressing industry needs.

Career Highlights

Throughout his career, Paul has worked with prominent companies such as Rockwool International A/S and Rockwool A/S. His experience in these organizations has allowed him to apply his inventive skills in practical settings, contributing to the development of cutting-edge technologies.

Collaborations

Paul has collaborated with talented individuals, including Andrew Wreathall Lee and Peter Benjamin Spoor. These partnerships have fostered a creative environment that has led to the successful development of various projects.

Conclusion

Paul J L H Bouwens is a distinguished inventor whose work in measurement technology has left a lasting impact. His patents and collaborations highlight his dedication to innovation and excellence in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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