Toledo, OH, United States of America

Paul G Chamberlin


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Paul G Chamberlin: Innovator in Particle Detection

Introduction

Paul G Chamberlin is a notable inventor based in Toledo, OH (US). He has made significant contributions to the field of particle detection, showcasing his innovative spirit and technical expertise. With a focus on developing advanced technologies, Chamberlin has secured a patent that highlights his work in this specialized area.

Latest Patents

Chamberlin holds a patent for a "Particle detector and method of detecting particles." This invention features a particle detector that includes a support member, a front electrode layer, and a semiconductor junction composed of at least an n-type layer and a p-type layer. The design incorporates a back electrode layer, which is specifically engineered to allow particles with energies ranging from about 0.5 MeV to about 5 MeV to enter the semiconductor junction. This innovative approach enhances the capabilities of particle detection technology.

Career Highlights

Throughout his career, Paul G Chamberlin has been associated with Lithium Innovations Company, LLC. His work at this company reflects his commitment to advancing technology in the field of particle detection. Chamberlin's patent demonstrates his ability to address complex challenges and contribute to the scientific community.

Collaborations

Chamberlin has collaborated with notable colleagues, including Ford B Cauffiel and Alvin D Compaan. These partnerships have likely enriched his work and fostered an environment of innovation and creativity.

Conclusion

Paul G Chamberlin is a distinguished inventor whose work in particle detection has made a significant impact. His patent and collaborations reflect his dedication to advancing technology in this field. Chamberlin's contributions continue to inspire future innovations in particle detection.

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